Conference
I/O design optimization flow for reliability in advanced CMOS nodes
•
IEEE International Reliability Physics Symposium Proceedings
• 2d.1.1-2d.1.5
Cacho F, Gupta A, Aggarwal A, Madan G, Bansal N, Rizvi M, Huard V, Garg P, Arnaud C, Delater R, Roma C, Ripp A